Dr Andrew Nelson is a senior research scientist at the Australian Centre for Neutron Scattering (ACNS) at the Australian Nuclear Science and Technology Organisation (ANSTO). He uses neutron and X-ray reflectometry to study the structure of thin films (on the order of 1-100 nm), which are ideal for examining the structure of thin film organic semiconductors. He is particularly interested in the development of techniques to study interfaces as they change in real time; during thermal or solvent annealing, for example. Part of these technique developments involves the application of advanced statistical techniques, such as Bayesian analysis, to model the resulting data.
Research keywords: neutron reflectometry, X-ray reflectometry, thin film characterisation, data analysis, kinetics
Affiliation: Australian Centre for Neutron Scattering, Australian Nuclear Science and Technology Organisation (ANSTO)
Address: Locked Bag 2001, Kirrawee DC, NSW 2232